Bi-Lipschitz arcs in metric spaces with controlled geometry

Abstract

In this paper, we generalize a bi-Lipschitz extension result of David and Semmes from Euclidean spaces to complete metric measure spaces with controlled geometry (Ahlfors regularity and supporting a Poincaré inequality). In particular, we find sharp conditions on metric measure spaces $X$ so that any bi-Lipschitz embedding of a subset of the real line into $X$ extends to a bi-Lipschitz embedding of the whole line. Along the way, we prove that if the complement of an open subset $Y$ of $X$ has small Assouad dimension, then it is a uniform domain. Finally, we prove a quantitative approximation of continua in $X$ by bi-Lipschitz curves.