We present some regularity results on equilibrium configurations for a variational model introduced to describe the epitaxial growth of an elastic film over a thick flat substrate when a lattice mismatch between the two materials is present. We also give a sufficient condition for local minimality based on second variation and apply it to determine analitycally the critical threshold for the local minimality of the flat configuration.
Cite this article
Nicola Fusco, Equilibrium configurations of epitaxially strained thin films. Atti Accad. Naz. Lincei Cl. Sci. Fis. Mat. Natur. 21 (2010), no. 3, pp. 341–348DOI 10.4171/RLM/576